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产品名称：SN74ABTH18652A
产品封装：LQFP64
产品品牌：Texas Instruments
PDF文档：下载
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电 话：0755-83035811
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产品介绍
特性
- Members of the Texas Instruments SCOPETM Family of Testability Products
- Members of the Texas Instruments WidebusTM Family
- Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
- Include D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data
- Bus Hold on Data Inputs Eliminates the Need for External Pullup Resistors
- B-Port Outputs of 'ABTH182652A Devices Have Equivalent 25-
 Series Resistors, So No External Resistors Are Required
- State-of-the-Art EPIC-IIBTM BiCMOS Design
- One Boundary-Scan Cell Per I/O Architecture Improves Scan Efficiency
- SCOPETM Instruction Set
- IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ
- Parallel-Signature Analysis at Inputs
- Pseudo-Random Pattern Generation From Outputs
- Sample Inputs/Toggle Outputs
- Binary Count From Outputs
- Device Identification
- Even-Parity Opcodes
- Packaged in 64-Pin Plastic Thin Quad Flat (PM) Packages Using 0.5-mm Center-to-Center Spacings and 68-Pin Ceramic Quad Flat (HV) Packages Using 25-mil Center-to-Center Spacings
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