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产品名称：SN74ABT18646
产品封装：SSOP56
产品品牌：Texas Instruments
PDF文档：下载
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电 话：0755-83035811
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产品介绍
特性
- Members of the Texas Instruments SCOPETM Family of Testability Products
- Members of the Texas Instruments WidebusTM Family
- Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
- SCOPETM Instruction Set
- IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ
- Parallel-Signature Analysis at Inputs
- Pseudo-Random Pattern Generation From Outputs
- Sample Inputs/Toggle Outputs
- Binary Count From Outputs
- Device Identification
- Even-Parity Opcodes
- State-of-the-Art EPIC-IIBTM BiCMOS Design Significantly Reduces Power Dissipation
- Packaged in Plastic Shrink Small-Outline (DL) and Thin Shrink Small-Outline (DGG) Packages and 380-mil Fine-Pitch Ceramic Flat (WD) Packages
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