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产品名称：SN74ABT18640
产品封装：LQFP64
产品品牌：Texas Instruments
PDF文档：下载
库 存：查看
电 话：0755-83035811
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产品介绍
特性
- Members of the Texas Instruments SCOPE TM Family of Testability Products
- Members of the Texas Instruments Widebus TM Family
- Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
- UBT TM (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode
- Two Boundary-Scan Cells per I/O for Greater Flexibility
- State-of-the-Art EPIC-IIB TM BiCMOS Design Significantly Reduces Power Dissipation
- SCOPE TM Instruction Set
- IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, and P1149.1A CLAMP and HIGHZ
- Parallel Signature Analysis at Inputs With Masking Option
- Pseudo-Random Pattern Generation From Outputs
- Sample Inputs/Toggle Outputs
- Binary Count From Outputs
- Device Identification
- Even-Parity Opcodes
- Packaged in 64-Pin Plastic Thin Quad Flat Pack Using 0.5-mm Center-to-Center Spacings and 68-Pin Ceramic Quad Flat Pack Using 25-mil Center-to-Center Spacings
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