• - 交流-直流(AC-DC)控制器和稳压器
• - 直流-直流(DC-DC)控制器、转换器和稳压器
• - 电压和电流管理
• - 通讯IC
• - 驱动器
• - 热管理

• - 时钟及数据分配
• - 标准逻辑

• - 放大器和比较器
• - 模拟开关
• - 数字电位计
• - 接口
• - EMI和RFI滤波器

• - EEPROM存储器
• - 非易失性只读存储器(NVRAM)
• - SRAM存储器

说明

This family of four LVDS data line receivers offers the widest common-mode input voltage range in the industry. These receivers provide an input voltage range specification compatible with a 5-V PECL signal as well as an overall increased ground-noise tolerance. They are in industry standard footprints with integrated termination as an option.

Precise control of the differential input voltage thresholds allows for inclusion of 50 mV of input voltage hysteresis to improve noise rejection on slowly changing input signals. The input thresholds are still no more than +50 mV over the full input common-mode voltage range.

The high-speed switching of LVDS signals usually necessitates the use of a line impedance matching resistor at the receiving-end of the cable or transmission media.

特性

• Controlled Baseline — One Assembly/Test Site, One Fabrication Site
• Extended Temperature Performance of Up to -55°C to 125°C
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product-Change Notification
• Qualification Pedigree⁽¹⁾
• 400-Mbps Signaling Rate⁽²⁾ and 200-Mxfr/s Data Transfer Rate
• Operates With a Single 3.3-V Supply
• -4-V to 5-V Common-Mode Input Voltage Range
• Differential Input Thresholds < ±50 mV With 50 mV of Hysteresis Over Entire Common-Mode Input Voltage Range
• Integrated 110- Line Termination Resistors On LVDT Products
• Complies With TIA/EIA-644 (LVDS)
• Active Failsafe Assures a High-Level Output With No Input
• Bus-Pin ESD Protection Exceeds 15-kV HBM
• Input Remains High-Impedance On Power Down
• TTL Inputs Are 5-V Tolerant
• Pin-Compatible With the AM26LS32, SN65LVDS32B, µA9637, SN65LVDS9637B

⁽¹⁾ Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
⁽²⁾ The signaling rate of a line is the number of voltage transitions that are made per second expressed in the units bps (bits per second).